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| Name: |
Professor M Prutton |
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| Department: |
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| Current EPSRC-Supported Research
Topics: |
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| Current EPSRC Support |
| There is no current EPSRC Support |
| Previous EPSRC Support |
| GR/K93792/01 | SURFACE MICROANALYSIS AND NON-DESTRUCTIVE 3D COMPOSITION DEPTH PROFILING | (P) |
| GR/K81812/01 | A FAST,COAXIAL CONE ELECTRON SPECTROMETER WITH PARALLEL DETECTION | (P) |
| GR/K32722/01 | QUANTITATIVE CHARACTERISATION OF 3D MICROSTRUCTURES: DOPANTS IN ELECTRONIC MATERIALS | (C) |
| GR/K01445/01 | SURFACE AND INTERFACE ELECTROMIGRATION IN ALLOY OVERLAY STRUCTURES STUDY BY MULTI-SPECTRAL AUGER MICROSCOPY | (P) |
| GR/J39946/01 | THE CHARACTERISATION & MODELLING OF ION BEAM INDUCED ALTERED LAYERED LAYERS TO ENHANCE AES & SIMS | (C) |
| GR/K39462/01 | THE CHARACTERISATION AND MODELLING OF ION BEAM INDUCED ALTERED LAYERED LAYERS TO ENHANCE AES & SIMS | (C) |
| GR/J23457/01 | A NEW,FAST,ELECTRON SPECTROMETER WITH PARALLEL DETECTION | (P) |
| GR/G40057/01 | THE SURFACE CRYSTALLOGRAPHY OF SEMICONDUCTORS GROWN ON METAL SEMICONDUCTOR SURFACES BY LEED AND STM | (C) |
| GR/H02417/01 | QUANTITATIVE SURFACE MICRO-ANALYSIS OF SMALL STRUCTURES | (P) |
| GR/F36620/01 | HIGH RESOLUTIONCHARACTERISATION OF VLSI STRUCTURES IN 1,2 AND 3 DIMENSIONS IED 1540 | (P) |
| GR/F34589/01 | HIGH PRECISION CHEMICAL ANALYSIS-IED 1559 | (P) |
| GR/E90120/01 | SURFACE STRUCTURE ANALYSIS OF SEMICONDUCTOR MATERIALS USING SCANNING TUNELLING MICROSCOPY | (C) |
| GR/E67269/01 | CHARACTERISATION OF SEMICONDUCTING MATERIALS AND DEVICES USING NANOMETRIC SCANNING AUGER MICROSCOPY | (P) |
| GR/E74908/01 | SCANNING TUNNELING MICROSCOPY AND LEED FOR SURFACE CRYSTALLOGRAPHY OF SEMICONDUCTOR MATERIALS | (C) |
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Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator
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