EPSRC logo

Details of Grant 

EPSRC Reference: GR/R46335/01
Title: Evolution of ion implantation damage in SI
Principal Investigator: Jones, Professor R
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Department: Physics
Organisation: University of Exeter
Scheme: Standard Research (Pre-FEC)
Starts: 01 October 2001 Ends: 30 September 2004 Value (£): 146,694
EPSRC Research Topic Classifications:
Materials Characterisation Materials Processing
EPSRC Industrial Sector Classifications:
Electronics
Related Grants:
Panel History:  
Summary on Grant Application Form
First principles theoretical calculations will be performed to identify stable interstitial clusters and examine the low energy pathways Involved in their evolution into extended defects in Ion implanted SI.Particular attention will be made to determine observable quantities of the clusters and extended defects. In particular, their electrical levels and optical transitions as well as vibrational properties will be investigated. The calculations will be linked with on-going experimental PL, DLTS and TEM studies in an intemationall consortium. The effect of impurities like boron, carbon and oxygen on the stability of the dusters will be considered.The structures of extended defects such as the (113) defect and Frank partials will be descried. Particular attention will be focussed on means by which transient enhanced diffusion is suppressed.
Key Findings
This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
Potential use in non-academic contexts
This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
Impacts
Description This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
Summary
Date Materialised
Sectors submitted by the Researcher
This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
Project URL:  
Further Information:  
Organisation Website: http://www.ex.ac.uk