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EPSRC Reference: GR/M82257/01
Title: SOFT X-RAY MAGNETIC SCATTERING FROM THIN FILM MAGNETIC MATERIALS AND SPIN STRIPES
Principal Investigator: Tanner, Professor BK
Other Investigators:
Hickey, Professor B Hatton, Professor PD
Researcher Co-Investigators:
Project Partners:
Department: Physics
Organisation: Durham, University of
Scheme: Standard Research (Pre-FEC)
Starts: 15 October 1999 Ends: 14 October 2002 Value (£): 110,331
EPSRC Research Topic Classifications:
Materials Characterisation
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors Electronics
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Summary on Grant Application Form
We propose a programme of Soft X-ray Magnetic Scattering (SoXMaS) measurements on thin metallic multilayers and charge stripe materials. The strong resonant enhancement at the L edges of the transition metals will be exploited. With particular emphasis on measurement of the diffuse magnetic scatter, we will study the magnetic structure within and at the interfaces of metallic multilayers. In Co/Cu, the origin of moderate field hysteresis and magnetic viscosity in multilayers will be investigated, and the interface roughness parameters, their time dependence and anisotropy determined in applied fields. In Au/Fe we will measure quantitatively the fraction of a.f. coupled material and the magnetisation distribution within the Fe layers. Variation in magnetisation distribution on annealing will be measured in Cu/permalloy layers and related to changes in macroscopic magnetic parameters. The magnetic roughness at exchange pinned interfaces will be measured and the behaviour of the magnetic interface parameters studied in applied fields. We will apply SoXMaS for the first time to the study of spin stripes in La(2-x)Sr(x)NiO4. Critical parameters and the correlation length will be measured and compared with the equivalent parameters of the charge stripes in these materials.
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