EPSRC Reference: |
GR/L96905/01 |
Title: |
SURFACE CRYSTALLOGRAPHY OF RARE-EARTH METALS ON SEMICONDUCTORS USING LEED, MEIS, AND STM |
Principal Investigator: |
Tear, Professor SP |
Other Investigators: |
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Researcher Co-Investigators: |
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Project Partners: |
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Department: |
Physics |
Organisation: |
University of York |
Scheme: |
Standard Research (Pre-FEC) |
Starts: |
01 May 1998 |
Ends: |
30 April 2001 |
Value (£): |
158,860
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EPSRC Research Topic Classifications: |
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EPSRC Industrial Sector Classifications: |
No relevance to Underpinning Sectors |
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Related Grants: |
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Panel History: |
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Summary on Grant Application Form |
The proposed research will determine for the first time the surface crystallography of novel 2-D rare-earth (RE) silicides and other sub-monolayer RE silicides using the established techniques of quantitative low-energy electron diffraction (LEED), quantitative medium energy ion scattering (MEIS), and scanning tunnelling microscopy (STM). Such RE silicides are of interest as new metal-silicon interfaces with potential device applications. The valuable opportunity will be taken to quantitatively compare the techniques of LEED and MEIS using the structures determined, by each method, of a similar RE-silicide surfaces. The use of Kikuchi electron diffraction (KED) for electron emission holography is to be further investigated using the 2_D RE silicides which are ideal candidates for this technique. The novel acquisition method developed at York for acquiring KED data will be exploited to provide information on the dependence of the Kikuchi electron diffraction on the selected energy of the loss process; the primary; and emission angles of the loss.
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Key Findings |
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Potential use in non-academic contexts |
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Impacts |
Description |
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Summary |
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Date Materialised |
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Sectors submitted by the Researcher |
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Project URL: |
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Further Information: |
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Organisation Website: |
http://www.york.ac.uk |