Name:	Professor SP Tear
Organisation:	University of York
Department:	Physics
Current EPSRC-Supported Research Topics:	Analytical Science Biomaterials Catalysis & Applied Catalysis Chemical Biology Condensed Matter Physics Image & Vision Computing Instrumentation Eng. & Dev. Manufacturing Machine & Plant Materials Characterisation Materials testing & eng.

Current EPSRC Support

EP/V012762/1 SEE MORE MAKE MORE: Secondary Electron Energy Measurement Optimised for Reliable Manufacture of Key Materials: Opportunity, Realisation, Exploitation (C) EP/S033394/1 Aberration-Corrected Scanning Transmission Electron Microscope with atomic resolution spectroscopy under controlled environmental conditions: AC-eSTEM (C)

Previous EPSRC Support

EP/E022634/1 Structural Studies of Strained and Nanostructured Rare Earth Silicides and Germanides Using MEIS and STM. (P) EP/D03471X/1 Surface magnetic and structural properties studied with metastable de-excitation spectroscopy. (C) EP/D034604/1 Surface magnetic and structural properties studied with metastable de-excitation spectroscopy. (P) EP/C536045/1 Development of an SEM detector for nanometric analysis (P) GR/R88823/01 Medium energy ion scattering of surface and near surface structure and composition with atomic resolution (P) GR/R88809/01 Medium energy ion scattering studies of surface and near surface structure and composition with atomic resolution (C) GR/R34257/01 Metastable De-exication Spectroscopy for Surface Analysis using a Laser-Focussed He* Beam (C) GR/L96905/01 SURFACE CRYSTALLOGRAPHY OF RARE-EARTH METALS ON SEMICONDUCTORS USING LEED, MEIS, AND STM (P) GR/K02022/01 EFFECT OF ALLOYING & MORPHOLOGY ON THE EXCHANGE COUPLING IN TRANSITION METAL MAGNETIC MULTILAYERS (C) GR/H71802/01 STM/SEM STUDIES OF INTERFACES OF MULTILAYER SEMICONDUCTER MATERIALS (P) GR/H32940/01 QUANTITATIVE LEED ANALYSES OF FE/SI(111),FESI2/SI(111) AND SI/FESI2/SI(111) (P) GR/G40057/01 THE SURFACE CRYSTALLOGRAPHY OF SEMICONDUCTORS GROWN ON METAL SEMICONDUCTOR SURFACES BY LEED AND STM (P) GR/E90120/01 SURFACE STRUCTURE ANALYSIS OF SEMICONDUCTOR MATERIALS USING SCANNING TUNELLING MICROSCOPY (P) GR/E74908/01 SCANNING TUNNELING MICROSCOPY AND LEED FOR SURFACE CRYSTALLOGRAPHY OF SEMICONDUCTOR MATERIALS (P)

Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator