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Details of Grant 

EPSRC Reference: GR/L85510/01
Title: JREI: SECONDARY ION MASS SPECTROSCOPY FOR CHEMICAL MICROSCOPY
Principal Investigator: Goodhew, Professor PJ
Other Investigators:
Tatlock, Professor GJ Bullough, Dr T Richardson, Professor N
Researcher Co-Investigators:
Project Partners:
Pre Nexus Migration
Department: Surface Science (IRC)
Organisation: University of Liverpool
Scheme: JREI
Starts: 18 May 1998 Ends: 17 May 2001 Value (£): 36,125
EPSRC Research Topic Classifications:
Instrumentation Eng. & Dev. Surfaces & Interfaces
EPSRC Industrial Sector Classifications:
Manufacturing
Related Grants:
Panel History:  
Summary on Grant Application Form
Secondary ion mass spectroscopy is widely used in the analysis of material surfaces as diverse as semiconductors, alloys and polymers. Over recent years, static, wide area analysis has been complemented by dynamic SIMS which probes the composition of a material perpendicular to the surface and by imaging SIMS which allows mapping of the surface at moderate ?~1um lateral resolution. There is an urgent need to develop low cost, chemical microscopy based on SIMS to enable the technique to be more widely available and be more readily applicable as support to other techniques of surface characterisation. Modern computer control and enhanced software have been integrated in a new chemical microscope to permit routine sample characterisation by SIMS in static, dynamic and imaging modes. We propose to exploit this new development instrumentation in support of on-going research at the University of Liverpool in Surface Science and Materials Science. This will involve complementary surface characterised of alloys, MBE grown semiconductors, chemisorption systems and more complex systems involving biosurfaces and mineral surfaces subjected to organic adsorption from aqueous environments.
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Organisation Website: http://www.liv.ac.uk