| EP/T01539X/1 | Large Bulk (RE)BCO superconducting magnets for desktop NMR/MRI | (C) |
| EP/T011351/1 | National Nuclear User Facility Phase 2: Management Grant | (P) |
| EP/S021663/1 | A LEAP 5000 XS for the UK National Atom Probe Facility | (C) |
| EP/P026427/1 | A bulk MgB2 magnet demonstrator for biomedical applications | (C) |
| EP/P001645/1 | Advanced Nuclear Materials | (C) |
| EP/P004458/1 | The UK National Nuclear User Facilites Working Group | (P) |
| EP/M017540/1 | Effect of Zr on the microstructure of corrosion resistant ODS steels | (P) |
| EP/N010868/1 | Strategic Equipment - a Dual Beam FIB/SEM with large area patterning, EBSD and nanoprobe capabilities | (C) |
| EP/M022900/1 | A National Thin-Film Cluster Facility for Advanced Functional Materials | (C) |
| EP/M018237/1 | Corrosion and hydrogen pick-up mechanisms in zirconium nuclear fuel cladding alloys in active environments | (P) |
| EP/M022803/1 | LEAP 5000XR for the UK National Atom Probe Facility | (C) |
| EP/K032518/1 | Characterisation of Nanomaterials for Energy | (C) |
| EP/K040375/1 | South of England Analytical Electron Microscope [ATEM] | (P) |
| EP/I034548/1 | The Quest for Ultimate Electromagnetics using Spatial Transformations (QUEST) | (C) |
| EP/I012400/1 | Characterization of the atomic scale structure of yttria-based particles in oxide dispersion strengthened steels | (P) |
| EP/I003274/1 | Performance and Reliability of Metallic Materials for Nuclear Fission Power Generation | (P) |
| EP/H046550/1 | Modelling and quantitative interpretation of electron energy-loss spectra using novel density functional theory methods | (C) |
| EP/F048009/1 | Platform Grant Support for Materials Characterisation at Oxford | (C) |
| EP/F016174/1 | Quantitative mapping of antiferromagnetic domains in metallic thin films | (P) |
| EP/E036384/1 | Zirconium alloys for high burn-up fuel in current and advanced light water-cooled reactors | (P) |
| GR/T19797/01 | Application of High Resolution Nanosims Analysis in the Biological Sciences | (P) |
| GR/S42262/01 | Low-Temperature Focussed Ion-Beam Fabrication of Nanoscale Single-Electron Intrinsic Josephson Devices | (P) |
| GR/M61023/01 | (JIF) INDUSTRIAL MATERIALS AND MANUFACTURING | (C) |
| GR/M66035/01 | DEVELOPMENT OF GROWTH PROCESSES FOR TL-BASED HTS THIN FILMS FOR MICROWAVE APPLICATIONS | (P) |
| GR/M15378/01 | SATIRE:SIMULTANEOUS & ADAPTIVE TRANSMISSION USING INTELLIGENT RECONFIGURABLE EQUIPMENT | (C) |
| GR/L92693/01 | PROCESSING OF T1(F)-1223 THICK FILMS & THEIR APPLICATION IN A PROTOTYPE RESISTIVE FAULT CURRENT LIMITER | (P) |
| GR/K93044/01 | HIGH TEMPERATURE SUPERCONDUCTING HIGH POWER FILTERS FOR CELLULAR APPLICATIONS | (C) |
| GR/L20061/01 | INVESTIGATION OF FLUORINE FOR ULTRA-SHALLOW P- AND N- TYPE JUNCTIONS IN HALF SUB MICRON BIPOLAR TRANSISTORS | (P) |
| GR/K83045/01 | PROCESSING OF THALLIUM-BASED SUPERCONDUCTING THICK FILMS FOR MICROWAVE AND CONDUCTOR APPLICATIONS. | (P) |
| GR/L03583/01 | TEM/HRTEM STUDIES OF ANTIMONY-BASED III-V HETEROSTRUCTURE LAYERS GROWN BY MOVPE AND MBE | (C) |
| GR/J77559/01 | DESIGN AND FABRICATION OF LARGE AREA HTS MICROWAVE DEVICES FOR A NOVEL SIGNAL PROCESSING SYSTEM | (P) |
| GR/H64958/01 | DEVELOPMENT OF HIGH TEMPERATURE SUPERCONDUCTING WIRES AND TAPES FOR APPLICATION IN DEMONSTRATOR DEVICES | (C) |
| GR/H84369/01 | ATOMIC SCALE CHARACTERISATION OF NANOSTRUCTURES | (C) |
| GR/H38485/01 | QUANTITATIVE ATOMIC SCALE ANALYSIS WITH AN OPTICAL ATOM PROBE | (C) |
| GR/H31912/01 | ATOMIC SCALE CHARACTERISAION OF NANOSTRUCTURES | (C) |
| GR/H03698/01 | IN-SITU DEPOSITION OF THALLIUM SUPERCONDUCTING THIN FILMS | (P) |
| GR/G05674/01 | SPUTTERING OF HIGH TEMPERATURE SUPERCONDUCTING FILMS | (P) |
| GR/F53122/01 | CORRELATION OF STRUCTURE 6 ELECTRICAL PROPERTIES IN HIGH TC CERAMIC SUPERCONDUCTORS | (C) |
| GR/F53139/01 | GROWTH & CHARACTERISATION OF THALLIUM-BASED HIGH TEMPERTURE SUPERCONDUCTING THIN FILMS | (P) |
| GR/F27253/01 | NUCLEATION AND GROWTH OF OXIDE SCALES ON STAINLESS STEELS | (C) |
| GR/F42577/01 | SPUTTERING OF HIGH TEMPERATURE SUPERCONDUCTOR FILMS ONTO PRACTICAL SUBSTRATE MATERIALS | (P) |
| GR/F06111/01 | APPLICATIONS OF ATOM PROBE MICROANALYSIS | (C) |
| GR/E87533/01 | APPLICATIONS OF ATOM PROBE MICROANALYSIS TO LOW DIMENSIONAL STRUCTURES IN SEMICONDUCTORS. | (P) |