Name:	Professor MG Dowsett
Organisation:	University of Warwick
Department:	Physics
Current EPSRC-Supported Research Topics:

Current EPSRC Support

There is no current EPSRC Support

Previous EPSRC Support

GR/S78919/01 Novel Ion Sources for Application in Nanometer-Scale Surface and Interface Analysis (P) GR/M52175/01 A COMBINED ULTRA LOW ENERGY SIMS AND MEDIUM ENERGY ION SCATTERING INSTRUMENT FOR NANOMETER - SCALE ANALYSIS (P) GR/M39701/01 SIMS APPLICATIONS & TECHNIQUE DEVELOPMENT FOR NM-SCALE DEPTH RESOLUTION AND ULTRA_SHALLOW PROFILING (P) GR/M37448/01 NEW APPROACHES TO DOPING THIN FILM DIAMOND FOR THE FORMATION OF HIGH PERFORMANCE ELECTRONIC DEVICES (P) GR/K71462/01 THE DEVELOPMENT AND APPLICATION OF SECONDARY ION MASS SPECTROMETRY(SIMS)FOR NANOAREA ANALYSIS (P) GR/K32715/01 THREE DIMENSIONAL QUANTITATIVE CHARACTERIZATION OF ELECTRONIC MATERIALS FROM BULK TO DOPANT CONCENTRATION (P) GR/H65177/01 THE CHEMICAL CHARACTERIZATION OF SEMICONDUCTOR LAYERS WITH SUB-NM DEPTH RESOLUTION (P) GR/H53525/01 MATHEMATICAL & EXPERIMENTAL TECHNIQUES FOR QUANTIFICATION AT INTERFACES ( EXTN TO IED 1559) (P) GR/H32759/01 TWO DIMENSIONAL ANALYSIS OF DOPANT AND IMPURITY DISTRIBUTIONS IN SEMICONDUCTORS USING SIMS (P) GR/H49856/01 TWO DIMENSIONAL ANALYSIS OF DOPANT AND IMPURITY DISTRIBUTIONS IN SEMICONDUCTORS USING SIMS (C) GR/F36613/01 IED 1540:HIGH RESOLUTION CHARACTERIZATION OF VLSI STRUCTURES IN 1,2 & 3 DIMENSIONS (P) GR/F34534/01 IED 1559: HIGH PRECISION CHEMICALS ANALYSIS FOR FUTURE SILICON MATERIALS AND DEVICES (P) GR/E40620/01 SIMS ANALYSIS OF LOW DIMENSIONAL STRUCTURES (P)

Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator