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| Name: |
Professor AG Cullis |
| Organisation: |
University of Sheffield |
| Department: |
Electronic and Electrical Engineering |
| Current EPSRC-Supported Research
Topics: |
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| Current EPSRC Support |
| There is no current EPSRC Support |
| Previous EPSRC Support |
| EP/G036748/1 | Basic Technology Nanorobotics : Transfer to applications, new science and industry | (C) |
| EP/F062710/1 | Nanoparticle and Element Distribution Studies of Ion Implantation Processes | (C) |
| EP/F033893/1 | Renaissance Germanium | (C) |
| EP/E034055/1 | Ultimate Microsocopy: Wavelength-Limited Resolution Without High Quality Lenses | (C) |
| EP/D064767/1 | Nano-scale organic photonic-structures | (C) |
| EP/D505712/1 | Support for the EPSRC National Centre for III-V Technologies at Sheffield | (C) |
| GR/S85689/01 | BASIC TECHNOLOGY: Nanorobotics - Technologies for Simultaneous Multidimensional Imaging & Manipulation of Nanoobjects | (C) |
| GR/T07879/01 | NETWORK:Silicon Research and Exploitation For the Nanotechnology Era | (C) |
| GR/S76076/01 | PROGRAMME GRANT: Control of light-matter interactions in advanced semiconductor nanostructures | (C) |
| GR/S85764/01 | Basic Technology: A Thousand Micro-emitters Per Square Millimetre: New Light On Organic Materials & Structures | (C) |
| GR/S27542/01 | Silicon-Based Infra-Red Lasers using Si/SiGe Quantum Cascades | (P) |
| GR/R75083/01 | Advanced reference-beam transmission electron microscopy | (P) |
| GR/S02150/01 | FEGTEM Nanostructural Studies of Functional and Structural Materials | (P) |
| GR/R65626/01 | Focused Ion Beam Machining and Deposition Applications to Functional and Structural Materials Research | (P) |
| GR/N65684/01 | SIGE FOR MOS TECHNOLOGIES PHASE 2: DEVELOPMENT AND APPLICATIONS | (P) |
| GR/N20997/01 | STUDIES OF FUNDAMENTAL PHYSICAL PROCESSES IN INAS-(AL) GAAS SELF-ASSEMBLED QUANTUM DOTS | (C) |
| GR/N23516/01 | GAINP/ALGAINP QUANTUM DOT LASERS | (C) |
| GR/N05178/01 | MID INFRA RED APPLICATIONS FOR SEMICONDUCTOR QUANTUM DOTS | (C) |
| GR/M11608/01 | COMPUTER PROCESSING OF ELECTRON MICROSCOPY DATA | (P) |
| GR/L53748/01 | SIGE FOR MOS TECHNOLOGIES | (P) |
| GR/L28821/01 | OPTO-ELECTRONIC INVESTIGATIONS OF SEMICONDUCTOR QUANTUM DOTS AND QUANTUM WIRES. | (C) |
| GR/L22195/01 | ADVANCED NANOSTRUCTURAL STUDIES OF FUNCTIONAL AND STRUCTURAL MATERIALS | (P) |
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Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator
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