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Researcher Details
 
Name: Professor RP Webb
Organisation: University of Surrey
Department: ATI Electronics
Current EPSRC-Supported Research Topics:
Energy - Nuclear Materials Characterisation

Current EPSRC Support
NS/A000059/1 UK National Ion Beam Centre(P)
EP/P001440/1 IBA-DAPNe: a new system for sub-micron scale molecular speciation and quantification(C)
EP/M01861X/1 Radiation Damage in Nanoporous Nuclear Materials(P)
Previous EPSRC Support
EP/N035216/1 Vacancy-Rich Silicon as a Flexible Thermoelectric Material(P)
EP/N015215/1 Quantum technology capital: Multi-species single-ion implantation(C)
EP/I036516/1 Ambient Pressure Mass Spectrometry at the Sub Micron Scale(P)
EP/H026622/1 Coherent Optical and Microwave Physics for Atomic-Scale Spintronics in Silicon (COMPASSS)(C)
EP/E035728/1 Laser Induced Beams of Radiation and their Applications (LIBRA(C)
EP/F012985/1 Enhancing new developments in ToF-SIMS through researcher exchanges(C)
EP/E032869/1 The Non Scaling FIxed Field Alternating Gradient (NS-FFAG) Accelerator(C)
EP/C009592/1 MeV ion nanobeams: nanotechnology for the 21st century(C)
EP/D032210/1 University of Surrey Ion Beam Centre(P)
EP/C009339/1 New Developments in ToF-SIMS Surface Mass Spectrometry with ATR-IR Spectroscopy(P)
EP/C008251/1 New Developments in ToF-SIMS Surface Mass Spectrometry with ATR-IR Spectroscopy(C)
GR/S91512/01 NETWORK: Research Network Bio-Medical Applications of High Energy Ion Beams.(C)
GR/S48363/01 Community Meeting on the Future of Ion Surface Interactions Research in the UK(P)
GR/R50097/01 The University of Surrey Ion Beam Centre(P)
GR/N39364/01 VALIDATION OF SHALLOW JUNCTIONS BY STM(C)
GR/M94434/01 AN ENHANCED UK FACILITY FOR ION BEAM ANALYSIS OF KEY STRATEGIC MATERIALS(C)
GR/M85210/01 IRRADIATION DAMAGE TECHNOLOGY FOR MANUFACTURABLE SUPERCONDUCTING DEVICES(P)
GR/L78512/01 THE UNIVERSITY OF SURREY ION BEAM CENTRE(C)
GR/L66199/01 IRRADIATION DAMAGE TECHNOLOGY FOR MANUFACTURABLE SUPERCONDUCTING DEVICES(C)
GR/K56247/01 THE UNIVERSITY OF SURREY ION BEAM FACILITY FOR MICROELECTRONICS(C)
GR/J42298/01 THE UNIVERSITY OF SURREY ION BEAM FACILITY FOR MICROELECTRONICS(C)
GR/H14366/01 NON-DESTRUCTIVE CHARACTERIZATION OF SEMICONDUCTORS USING MICROSCOPE-SPECTROPHOTOMETRY(C)
GR/F84683/01 A MOLECULAR DYNAMICS STUDY OF CARBON SELF-SPUTTERING USING MANY-BODY POTENTIALS(C)
GR/F57786/01 SCANNING TUNNELLING MICROSCOPY OF SEMICONDUCTORS(P)
GR/F36200/01 FUNDAMENTAL STUDIES TO DEVELOP NEW PROCESS AND DEVICE MODELS(P)
Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator