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Name: |
Professor JC Vickerman |
Organisation: |
University of Manchester, The |
Department: |
Chem Eng and Analytical Science |
Current EPSRC-Supported Research
Topics: |
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Current EPSRC Support |
There is no current EPSRC Support |
Previous EPSRC Support |
EP/K01353X/1 | Novel ion beams to enhance ionization in molecular secondary ion mass spectrometry | (P) |
EP/I016716/1 | MIB CDFA - Application of novel imaging technologies towards quantitative analytical phenotyping of single cells | (C) |
EP/G045623/1 | A new dynamic in mass spectral imaging for biological systems | (P) |
EP/F012985/1 | Enhancing new developments in ToF-SIMS through researcher exchanges | (P) |
EP/C009339/1 | New Developments in ToF-SIMS Surface Mass Spectrometry with ATR-IR Spectroscopy | (C) |
EP/C008251/1 | New Developments in ToF-SIMS Surface Mass Spectrometry with ATR-IR Spectroscopy | (P) |
GR/S57693/01 | The development of ToF-SIMS for metabolomics | (C) |
GR/R78459/01 | In-situ Particle Analysis Network (ISPAN) | (R) |
GR/R47844/01 | High Performance Imaging XPS Facility for Materials Research | (C) |
GR/M88129/01 | EXPLORATION OF NOVEL METHODS FOR ION YIELD ENHANCEMENT IN STATIC SIMS AND LASER PI SIMS | (P) |
GR/N05390/01 | FABRICATION OF A NEW GENERATION OF MOLECULAR NANOSTRUCTURES USING SNOM-BASED PHOTOLITHOGRAPHY | (C) |
GR/N20546/01 | DEVELOPMENT OF TOFSIMS INSTRUMENTATION AND METHODOLOGY FOR CHEMICAL OF CELLULAR SYSTEMS | (P) |
GR/L49475/01 | THE DEVELOPMENT OF A VERY HIGH MASS POLYATOMIC ION BEAM SYSTEM LARGE MOLECULE DESORPTION STATIC SIMS | (P) |
GR/L58606/01 | THE DEVELOPMENT OF A UNIQUE IMAGING TOFSIMS INSTRUMENT WITH LASER POSTIONISATION FACILITIES | (P) |
GR/K44015/01 | THE DEVELOPMENT OF A UNIQUE IMAGING TOFSIMS INSTRUMENT WITH FEMTOSECOND LASER POSTIONIZATION CAPABILITY | (P) |
GR/J27035/01 | STUDIES OF HIGH TEMPERATURE ALLOYS AND DUPLEX STAINLESS STEELS BY MEANS OF IMAGING SNMS | (P) |
GR/G38559/01 | SURFACES STUDIES OF TERNARY AND MORE COMPLEX OXIDE CATALYST MATERIALS | (C) |
GR/G30232/01 | A NEW IMAGING ELECTRON SPECTROMETER FOR RESEARCH AND INDUSTRY | (C) |
GR/F74585/01 | QUANTITATIVE SURFACE ANALYSIS BY SIMS USING LASER INDUCED POST-IONISATION | (P) |
GR/E49807/01 | FUNDAMENTAL STUDIES OF BIMETALLIC CATALYSTS | (P) |
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Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator
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