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Researcher Details
 
Name: Professor JW steeds
Organisation: University of Bristol
Department: Physics
Current EPSRC-Supported Research Topics:

Current EPSRC Support
There is no current EPSRC Support
Previous EPSRC Support
GR/S27177/01 A South-West e-Science Centre of Excellence at the University of Bristol:Digital Media and Interactivity in e-Science(C)
GR/R79395/01 Development and application of microscopic photoluminescence and Raman spectroscopy of SiC(P)
GR/M07786/01 RELATIONSHIP BETWEEN DEFECTS, IMPURITIES AND PHYSICAL PROPERTIES OF CVD DIAMOND FILMS(P)
GR/L23987/01 MICRO-RAMAN INVESTIGATIONS OF WIDE GAP OPTOELECTRONIC MATERIALS.(P)
GR/K65133/01 DEVELOPMENT OF DEVICE TECHNOLOGIES FOR DIAMOND ELECTRONICS(P)
GR/H92883/01 MICROSCOPIC LUMINESCENCE STUDIES OF II-VI AND III-V SEMICONDUCTORS(P)
GR/H92838/01 STUDY OF MATERIALS BY COHERENT ELECTRON DIFFRACTION AND BY ELECTRON HOLOGRAPHY(C)
GR/H62596/01 TOPOLOGICAL INTERACTION BETWEEN IMPURITIES, PHONONS & DISLOCATIONS IN SEMICONDUCTORS(P)
GR/H87810/01 COLLABORATIVE SEMICONDUCTOR RESEARCH WITH UNIVERSITY OF LILLE(P)
GR/H71154/01 FLUX DECORATION OF HIGH TEMPERATURE SUPERCONDUCTORS(P)
GR/H07214/01 DEVELOPMENT OF A THEORY OF LUMINESCENCE OF DISLOCATIONEXCITONS IN ZINC SELENIDE(P)
GR/G48145/01 QUANTITATIVE ELECTRON DIFFRACTION FROM A FIELD EMISSION TRANSMISSION ELECTRON MICROSCOPE(P)
GR/G47674/01 PHYSICS AND CHEMISTRY OF SURFACES AND INTERFACES OF ADVANCED MATERIALS(P)
GR/G35756/01 EXPLORATORY WORK ON INTERFACE ANALYSIS(P)
GR/F83686/01 CHARACTERIZATION OF ADVANCED MATERIALS BY ELECTRON DIFFRACTION AND MICROANALYSIS USING A FEGSTEM(P)
GR/F82870/01 OPTICAL AND ELECTRICAL PROPERTIES OF INDIVIDUAL DEFECTS IN 3-5 SUBSTRATES AND LOW DIMENSIONAL STRUCTURES(P)
GR/F99632/01 MICROSTRUCTURAL CHARACTERISATION OF 2-6 SEMICONDUCTORSGROWN AT HULL ELECTRO-OPTIC PROPERTIES AND QUANTUM WIR(P)
GR/F49491/01 POSITRON STUDIES OF RADIATION INDUCED & OTHER DEFECTS IN METALS & ALLOYS(C)
GR/F69987/01 SUPPORT FOR INSTITUTE OF ADVANCED MATERIALS AT THE UNIVERSITY OF BRISTOL(C)
GR/E76247/01 APPLICATION OF ADVANCED EELS ANALYSIS TO THE STUDY OF BORON IN METALS AND TO RUSTING(P)
GR/E96870/01 HIGH TEMPERATURE SUPERCONDUCTIVITY;PROPERTIES OF NOVEL SYSTEMS,MICROSTRUCTURE,GRANULARITY,PHYSICAL MECHANISM(C)
GR/F09464/01 ROLLING GRANT FOR BRISTOL ELECTRON MICROSCOPY GROUP(P)
GR/E20554/01 SCANNING OPTICAL MICROSCOPE FOR PHOTOLUMINESCENCE AND PHOTOCONDUCTIVITY STUDIES(C)
Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator