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Researcher Details
 
Name: Professor CG Smith
Organisation: University of Cambridge
Department: Physics
Current EPSRC-Supported Research Topics:
Condensed Matter Physics Optoelect. Devices & Circuits
Quantum Optics & Information

Current EPSRC Support
EP/X040380/1 EPSRC-SFI: Developing a Quantum Bus for germanium hole based spin qubits on silicon (Quantum Bus)(P)
EP/R029075/1 Non-Ergodic Quantum Manipulation(C)
Previous EPSRC Support
EP/S019324/1 Multiplexed Quantum Integrated Circuits(P)
EP/N015118/1 Quantum technology capital: QUES2T (Quantum Engineering of Solid-state Technologies)(C)
EP/M009505/1 Versatile Quantum Multiplexing(C)
EP/M022625/1 VERSATILE QUANTUM MULTIPLEXING EQUIPMENT AND FACILITY BID(C)
EP/K004077/1 Nanoelectronic Based Quantum Physics- Technology and Applications.(C)
EP/J003417/1 Beyond modulation doping(C)
EP/J00412X/1 Mapping Spin Polarisation in Quasi-One-Dimensional Channels(C)
EP/I014268/1 Quantum Multiplexer(C)
EP/I029575/1 Scanning probe microscopy of the quantum Hall effect and charge pumping in graphene for meterological applications(P)
EP/H017720/1 Electron-hole bilayers: Excitonic phases and collective modes(C)
EP/D008506/1 Physics and Technology of Semiconductor Quantum Nanostructures(C)
EP/C009487/1 A cryogen-free single-millikelvin system for measurement on nanoelectronic devices and quantum spin systems(C)
GR/R67521/01 Carbon Based Electronics - Quantized Adiabatic Charge Transport in Carbon Nanotubes(P)
GR/R54224/01 Semiconductor Quantum Nanoelectronics: Physics and Applications(C)
GR/N64595/01 SPINTRONICS NETWORK(C)
GR/M49922/01 A LOW TEMPERATURE HIGH FREQUENCY SCANNING NON-INVASIVE VOLTAGE PROBE(P)
GR/L42032/01 A LOW TEMPERATURE SCANNING NON-INVASIVE VOLTAGE PROBE(P)
GR/L73395/01 THE PHYSICS AND TECHNOLOGY OF 3D NANOSTRUCTURES AND DEVICES(C)
GR/K93013/01 ROPA QUANTIZED VIBRATIONS OF MICRO-MECHANICAL STRUCTURES COMBINED WITH SINGLE ELECTRON CHARGING(P)
GR/K89344/01 SUB-MICRON MAGNETIC CONTACTS TO SUB-MICRON SEMICONDUCTOR DEVICES(P)
GR/K34443/01 PHYSICS AND TECHNOLOGY OF THREE DIMENSIONAL NANOMETRE ELECTRONIC STRUCTURES(C)
GR/J40621/01 A MODIFIED FORCE MICROSCOPE AS A LOW TEMPERATURENM SCALE PROBE OF SUB-MICRON SEMICONDUCTOR DEVICES.(P)
GR/G63223/01 DATA ACQUISITION SYSTEM FOR MEASURING THE PROPERTIES OF A QUANTUM BOX(P)
Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator