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Researcher Details
 
Name: Professor AR Peaker
Organisation: University of Manchester, The
Department: Electrical and Electronic Engineering
Current EPSRC-Supported Research Topics:
Analytical Science Electronic Devices & Subsys.
Optoelect. Devices & Circuits RF & Microwave Technology

Current EPSRC Support
EP/P015581/1 Instrument to identify defects and impurities in wide band gap semiconductors via excited states(C)
Previous EPSRC Support
EP/M024911/1 SuperSilicon PV: extending the limits of material performance(C)
EP/K006975/1 Efficiency Enhancement of Silicon Photovoltaic Solar Cells by Passivation(C)
EP/H01182X/1 SiGe based Optoelectronics(C)
EP/H019987/1 Elimination of Efficiency Degradation Mechanisms in Silicon Photovoltaic Solar Cells(C)
EP/E027261/1 Semiconductor Research at the Materials-Device Interface(C)
EP/C009738/1 Instrument to probe the electronic and structural properties of impurities, defects and nanostructures in semiconductor materials and devices(P)
EP/C003098/1 Performance, degradation and defect structure of MOS devices using high-k materials as gate dielectrics(P)
GR/R24425/01 Defect Reactions in SiGe(P)
GR/M88303/01 JIF: ELECTROMAGNETICS CENTRE FOR MICROWAVE AND MILLIMETRE-WAVE DESIGN AND APPLICATIONS(C)
GR/R19595/01 Hydrogen In Semiconductor Silicon ... Dynamic Properties of Defects(P)
GR/M85180/01 HYDROGEN IN SEMICONDUCTOR SILICON(P)
GR/L77119/01 ERBIUM-DOPED SILICON: GERMANIUM LASER STRUCTURES(C)
GR/J76422/01 SILICON LIGHT EMITTING STRUCTURES UTILIZING RARE EARTH LUMINESCENCE(C)
GR/J76705/01 ANALYTICAL ELECTRON MICROSCOPY OF ADVANCED MATERIALS(C)
GR/H85113/01 SILICON QUANTUM DEVICES AND NONOSTRUCTURES.(C)
GR/H48705/01 SAMPLE PROVISION FOR 'IMPURITIES' IN LOW DIMENSIONAL STRUCTURES(P)
GR/H05562/01 EXTENDED DEFECTS IN SEMICONDUCTORS(P)
GR/F44625/01 SILICON LIGHT EMITTING DIODES(P)
GR/F71171/01 MOCVD OF III-V MATERIALS FOR INTEGRATION :OPTICAL AND ELECTRICAL SPECTROSCOPY(C)
GR/G00556/01 SILICON QUANTUM DEVICES AND NANOSTRUCTURES(C)
GR/F55980/01 SILICON LIGHT EMITTING DIODE(P)
GR/F20698/01 MATERIALS FOR SEMICONDUCTOR DEVICES(P)
GR/F55287/01 MATERIALS FOR SEMICONDUCTOR DEVICES(P)
GR/E22459/01 POINT DEFECTS IN SILICON GROWN FOR VLSI(P)
GR/D83361/01 LOW DIMENSIONAL DEVICES(C)
Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator