| EP/T025131/1 | Light and Elevated Temperature Induced Degradation of Silicon Solar Cells | (C) |
| EP/P015581/1 | Instrument to identify defects and impurities in wide band gap semiconductors via excited states | (C) |
| EP/M024911/1 | SuperSilicon PV: extending the limits of material performance | (C) |
| EP/K006975/1 | Efficiency Enhancement of Silicon Photovoltaic Solar Cells by Passivation | (C) |
| EP/H01182X/1 | SiGe based Optoelectronics | (C) |
| EP/H019987/1 | Elimination of Efficiency Degradation Mechanisms in Silicon Photovoltaic Solar Cells | (C) |
| EP/E027261/1 | Semiconductor Research at the Materials-Device Interface | (C) |
| EP/C009738/1 | Instrument to probe the electronic and structural properties of impurities, defects and nanostructures in semiconductor materials and devices | (P) |
| EP/C003098/1 | Performance, degradation and defect structure of MOS devices using high-k materials as gate dielectrics | (P) |
| GR/R24425/01 | Defect Reactions in SiGe | (P) |
| GR/M88303/01 | JIF: ELECTROMAGNETICS CENTRE FOR MICROWAVE AND MILLIMETRE-WAVE DESIGN AND APPLICATIONS | (C) |
| GR/R19595/01 | Hydrogen In Semiconductor Silicon ... Dynamic Properties of Defects | (P) |
| GR/M85180/01 | HYDROGEN IN SEMICONDUCTOR SILICON | (P) |
| GR/L77119/01 | ERBIUM-DOPED SILICON: GERMANIUM LASER STRUCTURES | (C) |
| GR/J76422/01 | SILICON LIGHT EMITTING STRUCTURES UTILIZING RARE EARTH LUMINESCENCE | (C) |
| GR/J76705/01 | ANALYTICAL ELECTRON MICROSCOPY OF ADVANCED MATERIALS | (C) |
| GR/H85113/01 | SILICON QUANTUM DEVICES AND NONOSTRUCTURES. | (C) |
| GR/H48705/01 | SAMPLE PROVISION FOR 'IMPURITIES' IN LOW DIMENSIONAL STRUCTURES | (P) |
| GR/H05562/01 | EXTENDED DEFECTS IN SEMICONDUCTORS | (P) |
| GR/F44625/01 | SILICON LIGHT EMITTING DIODES | (P) |
| GR/F71171/01 | MOCVD OF III-V MATERIALS FOR INTEGRATION :OPTICAL AND ELECTRICAL SPECTROSCOPY | (C) |
| GR/G00556/01 | SILICON QUANTUM DEVICES AND NANOSTRUCTURES | (C) |
| GR/F55980/01 | SILICON LIGHT EMITTING DIODE | (P) |
| GR/F20698/01 | MATERIALS FOR SEMICONDUCTOR DEVICES | (P) |
| GR/F55287/01 | MATERIALS FOR SEMICONDUCTOR DEVICES | (P) |
| GR/E22459/01 | POINT DEFECTS IN SILICON GROWN FOR VLSI | (P) |
| GR/D83361/01 | LOW DIMENSIONAL DEVICES | (C) |