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Details of Grant 

EPSRC Reference: NS/A000015/1
Title: EPSRC Facility in X-Ray Photoelectron Spectroscopy (NEXUS)
Principal Investigator: Cumpson, Professor P
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Department: Mechanical and Systems Engineering
Organisation: Newcastle University
Scheme: Mid-range Facility
Starts: 01 May 2011 Ends: 30 June 2017 Value (£): 3,897,501
EPSRC Research Topic Classifications:
Materials Characterisation
EPSRC Industrial Sector Classifications:
Related Grants:
Panel History:  
Summary on Grant Application Form
NEXUS is the UK EPSRC X-ray photoelectron spectroscopy (XPS) User's service. XPS is a technique which analyses the surface of a device or sample by irradiating it with x-rays and simultaneously measuring the energy spectrum of photoelectrons emitted. This information reveals information about the surface chemistry and electronic structure of the material, key aspects in the characterisation of materials and devices as part of a wide range of fundamental research, and often essential to getting academic work published in high-impact journals. XPS is also vital for a range of applied and industrial problems, as the surface of a component can often dominate the performance of a product in terms of abrasion, adhesion, appearance, lubrication, or failed electrical contact due to oxidation, corrosion or contamination, as well as having fundamental implications for the physics and chemistry of the surfaces of advanced materials.

The NEXUS facility has a remit to provide the best specification commercially-available facilities for XPS in terms of energy resolution, lateral resolution and angular resolution available from laboratory-based instruments worldwide. We provide the widest range of associated equipment and facilities in support of XPS research needs of NEXUS users, selected in consultation with those users. We are internationally-leading in collaborative XPS data sharing and remote access and achieve sustainability in these activities. Services are provided to a range of academic communities, with particular focus on those which have not traditionally used the technique but for which it could provide a valuable new tool in surface analysis.

Key analytical software for the analysis of XPS and related spectra is provided for all users, with remote access and web-enabled collaboration a key feature. An experienced team is available to assist and advise on interpretation and data reduction. Hands-on training is provided in XPS measurement and analysis, interpretation and quantification of XPS spectra and images, with additional formal training provided when the need is identified.

For more information see: http://www.ncl.ac.uk/nexus/
Key Findings
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Potential use in non-academic contexts
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Date Materialised
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Organisation Website: http://www.ncl.ac.uk