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Details of Grant 

EPSRC Reference: GR/S96463/01
Title: Novel Atom Scale Characterisation of Advanced Thin Film Structures
Principal Investigator: Cerezo, Professor A
Other Investigators:
Petford-Long, Professor A
Researcher Co-Investigators:
Project Partners:
FEI Company Oxford Nanoscience Seagate Technology
Department: Materials
Organisation: University of Oxford
Scheme: LINK
Starts: 01 June 2005 Ends: 30 November 2008 Value (£): 193,252
EPSRC Research Topic Classifications:
Materials Characterisation
EPSRC Industrial Sector Classifications:
Communications Electronics
Related Grants:
GR/S96470/01
Panel History:  
Summary on Grant Application Form
The aim of the project is to provide a scanning atom probe analytical tool complemented by a suitable specimen preparation process to allow the development and subsequent reproducible manufacture of new thin film structures for advanced applications such as magnetic recording heads. The data from the scanning atom probe will be correlated with and calibrated by use of high resolution x-ray metrology. Through the detailed study by scanning atom probe microscopy of the interface structures of thin magnetic layers used in magnetic storage devices, the models of interface structure used in the detailed interpretation of diffuse x-ray scatter will be refined and enhanced.
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Summary
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Further Information:  
Organisation Website: http://www.ox.ac.uk