Details of Grant 

EPSRC Reference:	GR/R62175/01
Title:	Microanalysis at nano-resolution using HAADF and STEM
Principal Investigator:	Cockayne, Professor D
Other Investigators:	Titchmarsh, Professor J
Researcher Co-Investigators:
Project Partners:	JEOL
Department:	Materials
Organisation:	University of Oxford
Scheme:	JREI
Starts:	01 November 2001	Ends:	31 October 2004	Value (£):	60,000
EPSRC Research Topic Classifications:	Materials Characterisation
EPSRC Industrial Sector Classifications:	Manufacturing
Related Grants:
Panel History:
Summary on Grant Application Form
Materials properties are being investigated increasingly at the nanoscale. To carry out these investigations, characterization tools capable of nanometer scale spatial resolution are essential. Scanning transmission electron microscope (STEM) microanalysis combined with high angle annular dark field microscopy (HAADF) is one of the key techniques. This application seeks funding for a HAADF and STEM attachment to an existing high resolution 300kV TEM, to be used in a range of materials research projects requiring data on the nanoscale. These projects include studies of segregation in quantum dots, the structure of intergranular glassy phases, the microstructure of filled nanotubes, interfacial segregation, precipitation, embrittlement of reactor pressure vessels, improved particle-reinforced composites, hard coatings and crack growth in austenitic alloys.
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Organisation Website:	http://www.ox.ac.uk