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Details of Grant 

EPSRC Reference: GR/R47851/01
Title: Characterisation of Surfaces, Thin Film and Nanometre Scale Structures by X-Ray Photoelectron Spectroscopy
Principal Investigator: Briggs, Professor D
Other Investigators:
Tendler, Professor S Jones, Professor RG Seddon, Professor AB
Howdle, Professor S Harrison, Dr I Beton, Professor PH
Roberts, Professor C Moriarty, Professor PJ Hunt, Dr MRC
Chesters, Professor MA Foxon, Professor CT Grant, Professor DM
Brown, Professor PD Shakesheff, Professor K Walker, Professor GS
Davies, Professor M
Researcher Co-Investigators:
Project Partners:
Department: Sch of Pharmaceutical Sciences
Organisation: University of Nottingham
Scheme: Standard Research (Pre-FEC)
Starts: 01 February 2002 Ends: 31 January 2005 Value (£): 653,331
EPSRC Research Topic Classifications:
Biological & Medicinal Chem. Biomaterials
Materials Characterisation Surfaces & Interfaces
EPSRC Industrial Sector Classifications:
Healthcare Chemicals
Manufacturing
Related Grants:
Panel History:  
Summary on Grant Application Form
This application seeks to establish and operate a state-of-the-art XPS instrument, with facilities for UHV sample modification/thin film deposition and high depth resolution depth profiling, as a shared resource between groups in five schools involved in the development and analysis of novel materials at the University of Nottingham. Although XPS is a well-established technique, the analytical challenges require levels of performance which are currently unavailable to UK academia.The proposed instrumentation will complement and expand upon the internationally competitive work of the applicants, promoting high-quality multi disciplinary research, with benefit to the University and the UK. The project will focus upon the following: XPS of polymers designed for immunosensor, drug delivery and molecular separation applications; XPS of biodegradable polymer surfaces designed as tissue engineering scaffolds; XPS of self-assembled monolayers and (bio)monolayers with spatially defined chemistries; XPS of modified interfaces in electroluminescent devices; surface analysis and depth profiling of alloys and ceramic coatings designed as biomedical implant materials; bulk and surface analysis of photonic glasses and cross-sectional analysis of optical waveguide fibres; XPS of heterogeneous catalysts for reduction/removal of Nox pollutants; characterisation of adsorbed fullerenes, fullerene derivatives and passivated nanocrystals; depth profiling of multilayer metallisation of GaN (eg for blue/uv LEDs) and XPS of magnetic nitrides/arsenides. These areas have been chosen to combine both exploitation of current research and to catalyse new areas of collaboration between the applicants.
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Summary
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Further Information:  
Organisation Website: http://www.nottingham.ac.uk