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Details of Grant 

EPSRC Reference: GR/R46663/01
Title: Feasibility study of Focussed Ion Beam (FIB) direct write for micro-photonic applications
Principal Investigator: Eason, Professor RW
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Department: Optoelectronics Research Ctr (closed)
Organisation: University of Southampton
Scheme: Standard Research (Pre-FEC)
Starts: 19 June 2001 Ends: 18 March 2002 Value (£): 10,000
EPSRC Research Topic Classifications:
Optical Devices & Subsystems Optoelect. Devices & Circuits
EPSRC Industrial Sector Classifications:
Electronics
Related Grants:
Panel History:  
Summary on Grant Application Form
Focussed Ion Beam (FIB) technology has been applied very successfully to a wide range of activities in the microelectronics and semiconductor sectors, but much less extensively, if at all, to host materials such as nonlinear optical, ferroelectrics and piezoelectrics. We intend to write metal electrodes, gratings and ion-beam masks on a range of crystal hosts for subsequent actuation, implantation an duse in electric field periodic poling studies.The aim is to establish the utility of this technique using a range of line widths and deposition conditions in areas where FIB has currently not been applied. MEMS and MOEMS structures will be investigated and once the technique is shown to be sucessful, a larger 2-3 year grant will be proposed, using the results of this feasibility study.
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Organisation Website: http://www.soton.ac.uk