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Details of Grant 

EPSRC Reference: GR/M48260/01
Title: LOW TEMPERATURE SCANNING CAPACITANCE & ATOMIC FORCE MICROSCOPY OF LOW DIMENSIONALSTRUCTURES
Principal Investigator: Mellor, Dr CJ
Other Investigators:
Moriarty, Professor PJ Kent, Professor A
Researcher Co-Investigators:
Project Partners:
Department: Sch of Physics & Astronomy
Organisation: University of Nottingham
Scheme: Standard Research (Pre-FEC)
Starts: 27 September 1999 Ends: 26 March 2003 Value (£): 372,214
EPSRC Research Topic Classifications:
Condensed Matter Physics Instrumentation Eng. & Dev.
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors Electronics
Related Grants:
Panel History:  
Summary on Grant Application Form
The aim of the programme is to devlop an instrument capable of imaging capacitance variations at semiconductor surfaces at low temperature and high magnetic fields. The microscope will also be capable of atomic force imaging so that capacitive and topographic information can be correlated. SCM is unique in that it maps the electrical activity of a sample and is able to image conducting layers buried within a sample.The instrument will provide valuable information on such topics as the nature of edge states in the QHE, the role and nature of diorder in low dimensional structures and the breakdown of the QHE. The microscope is also able to probe other sub-surface structures such as quantum wires and dots. At high temperatures we will use the instrument to probe epitaxial GaN compounds to clarify the position of the electrically active dopants. The temperature dependence of the capacitance variation should enable the activation energies to be extracted.
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Organisation Website: http://www.nottingham.ac.uk