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Details of Grant 

EPSRC Reference: GR/M34287/01
Title: JREI:X-RAY SCATTERING STUDIES OF THE STRUCTURE OF SUPERLATTICES & THIN FILMS OF STRUCTURAL PHASE TRANSITIONS
Principal Investigator: Cowley, Professor R
Other Investigators:
Boothroyd, Professor A
Researcher Co-Investigators:
Project Partners:
Phillips Analytical
Department: Oxford Physics
Organisation: University of Oxford
Scheme: JREI
Starts: 01 March 1999 Ends: 28 February 2002 Value (£): 113,171
EPSRC Research Topic Classifications:
Materials Characterisation
EPSRC Industrial Sector Classifications:
Electronics
Related Grants:
Panel History:  
Summary on Grant Application Form
X-ray scattering measurements will be made of the structure of thin films and superlattices for both metals and semiconductors in collaboration particularly with the LaMBE facility and MOVPE antimonide facility in Oxford Physics. Detailed studies of the structure of thin lattice mismatched films will provide information about when islands are grown and the perfection of the film as a function of film thickness. Studies of superlattices will enable us to distinguish between conformal and non-conformal roughness of the interfaces and in systems in which the layers have a large mismatch explore the structure of the quantum dots which may be found in one of the materials. These results will lead to a better understanding of the growth of thin films and hence to better control of the materials grown. We hope to extend these studies to ferroelectric films in the future. The phase transitions of bulk ferroelectrics will be studied particularly for systems with competing interactions. Measurements of the disordered low temperature structure for systems, like Ca doped SrTiO3, will enable us to understand the non-ergodic behaviour.
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Organisation Website: http://www.ox.ac.uk