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Details of Grant 

EPSRC Reference: GR/L86869/01
Title: JREI: SCANNING ATOM PROBE FOR NANOSCALE CHARACTERISATION OF ADVANCED MATERIALS
Principal Investigator: Cerezo, Professor A
Other Investigators:
Smith, Professor G
Researcher Co-Investigators:
Project Partners:
Pre Nexus Migration
Department: Materials
Organisation: University of Oxford
Scheme: JREI
Starts: 06 July 1998 Ends: 05 July 1999 Value (£): 101,381
EPSRC Research Topic Classifications:
Instrumentation Eng. & Dev.
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
The aim of this proposal is to establish a unique facility for the nanoscale characterisation of advanced materials. The Scanning Atom Probe (SAP) combines design elements from atom probe field ion microscopy (APFIM) and scanning tunnelling microscopy (STM). Atomic-resolution microanalysis is carried out on microprotrusions, which are normally produced on initially flat specimen surfaces by ion milling. The analysis is performed by APFIM time-of-flight mass spectrometry. A microminature electrode geometry is used to select the area of the sample for investigation, using STM micromanipulation and alignment techniques. The new instrument will be produced by customisation of a standard Omicron MultiProbe ultra-high vacuum system. The suppliers have offered a large special discount on this equipment. Applications are envisaged in studying the atomic-scale chemical composition of nanoscale multilayered structures such as magnetic hard disk read heads; investigating fine-scale chemistry of interfaces in ULSI integrated circuitry; characterisation of STM and AFM probes; and the study of field emitter arrays currently under development for the next stage of flat screen display technology. Other potential uses of the instrument would be in the study of oxide films, and in the characterisation of heterogeneous catalysts.
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Organisation Website: http://www.ox.ac.uk