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Details of Grant 

EPSRC Reference: GR/L86739/01
Title: JREI: QUANTITATIVE TOPOGRAPHIC MAPPING OF MATERIALS SURFACES USING ZYGO SCANNING WHITE LIGHT INTERFEROMETER
Principal Investigator: McPhail, Dr DS
Other Investigators:
Hench, Professor L Flower, Professor H
Researcher Co-Investigators:
Project Partners:
Lambda Photometrics Ltd
Department: Materials
Organisation: Imperial College London
Scheme: JREI
Starts: 11 March 1998 Ends: 10 March 1999 Value (£): 63,682
EPSRC Research Topic Classifications:
Surfaces & Interfaces
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
A ZYGO NewView 200 White Light Scanning Interferometer will be used to investigate the surface topography of a wide range of materials as a function of growth, processing and testing. Almost every research programme in the department will benefit from this new instrument as will many inter-departmental and industrial collaborations. The ZYGO interferometer yields maps of surfaces with the same vertical resolution as our Atomic Force Microscope (0.1nm) but has a far greater horizontal range (5mm as opposed to 40mm) and vertical range (100mm as opposed to 5mm) so that it will be possible to acquire quantitative maps of surfaces in systems the AFM cannot accommodate (viz cracks in metals, bevels on semiconductors, large grain structures, bio-materials and composites). Furthermore the ZYGO interferometer is an air based non-destructive technique so that problems commonly found in Scanning Electron Microscopy such as dehydration and charging (sample coating) will be avoided (viz bio-materials, gels and hydration reactions in cements). The ZYGO interferometer is urgently needed in seven key research areas identified below and will provide information unattainable with our existing characterisation infrastructure.
Key Findings
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Summary
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Organisation Website: http://www.imperial.ac.uk