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Details of Grant 

EPSRC Reference: GR/L24687/01
Title: CRANFIELD SCANNING PROBE MICROSCOPY/NANOINDENTATION FACILITY
Principal Investigator: Whatmore, Professor RW
Other Investigators:
Williams, Mr D Nicholls, Professor JR Ashwell, Professor G
Researcher Co-Investigators:
Project Partners:
Gearing Scientific IBM UK Ltd Pre Nexus Migration
Rolls-Royce Plc (UK)
Department: Sch of Industrial and Manufacturing Scie
Organisation: Cranfield University
Scheme: JREI
Starts: 05 March 1997 Ends: 04 September 2000 Value (£): 90,014
EPSRC Research Topic Classifications:
Materials Characterisation
EPSRC Industrial Sector Classifications:
Construction
Related Grants:
Panel History:  
Summary on Grant Application Form
The project will entail the purchase of a Topometrix Explorer Scanning Probe Microscopy Systems, a Micromaterials Nanoindenter System and a Uniphase low noise argon ion laser for optical studies. It will also include the fabrication in-house of jigs and fittings to permit the accurate movement of samples between the Nanoindenter and the SPM.These items will form a Scanning Probe Microscopy and nanoindentation facility which will be used across a wide range of existing and future projects within SIMS, covering the mechanical behaviour of materials at the nanometric level, the growth of thin film metals and oxides and the study of their electrical and optical properties, and the study of Langmuir-Blodgett films, their non-linear optical behaviour and their second harmonic generation behaviour.Initially the facility would be used in its standard form but later it is intended to develop new techniques based on these instruments to explore AFM sensors using Ferroelectric films, the combined use of SPM and Nanoindentation to explore multilayer nanometric coatings, and laser stimulated emissions of LB and FE films.
Key Findings
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Summary
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Further Information:  
Organisation Website: http://www.cranfield.ac.uk