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Details of Grant 

EPSRC Reference: GR/L03408/01
Title: NEAR-FIELD OPTICAL SPECTROSCOPY OF SEMICONDUCTOR SYSTEMS
Principal Investigator: Richards, Professor D
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Toshiba
Department: Physics
Organisation: University of Cambridge
Scheme: Standard Research (Pre-FEC)
Starts: 01 July 1996 Ends: 30 September 1999 Value (£): 111,650
EPSRC Research Topic Classifications:
Materials Characterisation
EPSRC Industrial Sector Classifications:
Related Grants:
Panel History:  
Summary on Grant Application Form
Utilising the recently innovated technique of scanning near-field optical microscopy (SNOM), ultra-microprobe optical spectroscopy is made possible. Applied to photoluminescence, electroluminescence and Raman spectroscopies, this provides a new access to the investigation of small quantum systems and allows inhomogeneous broadening of spectral line shapes to be circumvented. Many of the attractive features of conventional optical spectroscopy are retained, such as non-evasiveness, reliability and polarisation selection rules, but the technique allows surfaces to be probed spectoscopically at a resolution (typically ~100nm) inaccessible by traditional far-field techniques. The technique will be applied to a number of semiconductor material systems and devices: microstructed III-V semiconductor systems, inorganic nanocrystals and electroluminescent polymer mixtures and in diblock copolymers). Indeed, the high spatial resolution will allow a single mesoscopic structure or nanocrystal to be accessed and enable the study of effects such as carrier diffusion and high field transport in semiconductor devices. The near field nature of the probe makes it ideal for the investigation of emission in the vicinity of photonic structures.Key Words: Materials; Polymers; Optics; Physics; Semiconductors; SPM; Spectroscopy; Microstructures; Nanocrystals.
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Organisation Website: http://www.cam.ac.uk