| EPSRC Reference: |
GR/J77979/01 |
| Title: |
CHARACTERISATION OF DIELECTRICS FOR LOW POWER CMOS CIRCUITS AND SINGLE ELECTRON ELECTRONICS |
| Principal Investigator: |
Taylor, Professor S |
| Other Investigators: |
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| Project Partners: |
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| Department: |
Electrical Engineering and Electronics |
| Organisation: |
University of Liverpool |
| Scheme: |
Standard Research (Pre-FEC) |
| Starts: |
01 January 1995 |
Ends: |
30 September 1998 |
Value (£): |
146,759
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| EPSRC Research Topic Classifications: |
| Materials Characterisation |
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Summary on Grant Application Form |
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The project objectives are:(i) to characterise at the device level advanced gate dielectrics suitable for use in deep low power submicron CMOS circuits,(ii) to gain a more complete understanding of single electron/defect interaction and its effects upon device performance and reliability.
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Key Findings |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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Potential use in non-academic contexts |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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Impacts |
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| Description |
This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk |
| Summary |
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| Date Materialised |
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Sectors submitted by the Researcher |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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| Project URL: |
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| Further Information: |
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| Organisation Website: |
http://www.liv.ac.uk |