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Details of Grant 

EPSRC Reference: GR/S97194/01
Title: The Impact of Interface Roughness and Self-Heating on the Performance of Nano-Scale MOSFETs
Principal Investigator: Watling, Dr J
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Department: Electronics and Electrical Engineering
Organisation: University of Glasgow
Scheme: Advanced Fellowship (Pre-FEC)
Starts: 01 October 2004 Ends: 30 September 2009 Value (£): 229,068
EPSRC Research Topic Classifications:
Electronic Devices & Subsys.
EPSRC Industrial Sector Classifications:
Electronics
Related Grants:
Panel History:
Panel DatePanel NameOutcome
19 Apr 2004 ICT Fellowships 2004 - ARF Interview Panel Deferred
18 Mar 2004 ICT Fellowships 2004 Sift Panel Deferred
Summary on Grant Application Form
The phenomenal growth of silicon-based circuits which has driven the semiconductor industry now faces serious obstacles which will hinder the continued increase in density and performance. Due to these limitations and associated factors the semiconductor industry (International Technology Roadmap for Semiconductors) advocates a departure fromthe classical MOSFET design towards novel structures such as Silicon-on-Insulator (SOI) and Strained-Si. Two major problems limiting the future operation of nano-scale MOSFETs have been identified as: Surface roughness scattering (limiting carrier mobility) and self/lattice-heating (limiting both carrier mobility and device reliability).At present, however, there are no adequate models and simulation tools which are able to accurately predict an( model both of these phenomena in present and future nano-scale CMOS transistors and their impact on device and circuit performance. The overall aim of this proposal is to develop the next generation of models and tools for simulationof these effects in nano-CMOS devices. The new models and algorithms developed will enable the reliable and accurate modelling of the nano-scale transistors, circuits and systems composed of these devices.
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Organisation Website: http://www.gla.ac.uk