EPSRC Reference: |
GR/R19700/01 |
Title: |
A New Method For Non-Destructive Depth Profiling In Thin Film Materials |
Principal Investigator: |
Rogers, Professor K |
Other Investigators: |
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Researcher Co-Investigators: |
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Project Partners: |
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Department: |
Cranfield Defence and Security |
Organisation: |
Cranfield University |
Scheme: |
Standard Research (Pre-FEC) |
Starts: |
01 October 2001 |
Ends: |
30 September 2004 |
Value (£): |
82,880
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EPSRC Research Topic Classifications: |
Condensed Matter Physics |
Materials Characterisation |
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EPSRC Industrial Sector Classifications: |
No relevance to Underpinning Sectors |
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Related Grants: |
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Panel History: |
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Summary on Grant Application Form |
Materials formed as polycrystalline thin films are used in a wide range of applications due to their unique functional properties which may be quite different to that of the their bulk behaviour. However, most thin film fabrication methods inherently produce structures possessing characteristics which are inhomogeneous with depth. Thus there is a need to develop non-destructive methods which are able to provide structural information at any depth within the film.The overall aim of this proposal is to produce a generic computer analysis system for the derivation of structural data arising at any depth within a thin film. The structural probes employed to generate primary data will be X-ray diffraction and particle induced X-ray emission Model thin films will be carefully fabricated and used to test and refine the computer codes. The final computer program will be applied to real problems (heterojunction interdifussion & coating integrity) and made available to a wide community via the World Wide Web.
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Key Findings |
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Potential use in non-academic contexts |
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Impacts |
Description |
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Summary |
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Date Materialised |
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Sectors submitted by the Researcher |
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Project URL: |
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Further Information: |
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Organisation Website: |
http://www.cranfield.ac.uk |