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Details of Grant 

EPSRC Reference: GR/M76089/01
Title: INTEGRATED AFM SENSORS FOR SCANNING HALL PROBE MICROSCOPY
Principal Investigator: Henini, Professor M
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Department: Sch of Physics & Astronomy
Organisation: University of Nottingham
Scheme: Standard Research (Pre-FEC)
Starts: 02 February 2000 Ends: 01 February 2003 Value (£): 16,110
EPSRC Research Topic Classifications:
Condensed Matter Physics
EPSRC Industrial Sector Classifications:
Electronics No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
We have recently developed a novel non-invasive magnetic imaging technique called scanning Hall probe microscopy (SHPM) whereby a microscopic heterostructure Hall probe is used to generate profiles of local magnetic induction in magnetic materials. Our current system represents the world-wide state-of-the-art and has allowed us to perform a number of unique experiments as well as attract considerable international interest. At present SHPM uses an integrated STM tip to find and track the sample surface, and limits our investigations to conducting, connected structures. We propose to widen the scope of the system by developing an AFM-tracking version using a Hall probe integrated together with a piezoresistive cantilever deflection sensor in one MBE-grow III-V sample. We have already demonstrated the principle of piezoresistive detection in an AlGaAs cantilever and are seeking funds to integrate a sub-micron Hall probe and AFM tip. Projected figures-of-merit of the integrated system look very promising and will be demonstrated through studies of ferromagnetic nanostructures and sensors as well as superconducting devices. The AFM-guided SHPM will form an excellent complement to existing magnetic force (MFM) imaging systems which are currently standard tools in the magnetic storage industry.
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Organisation Website: http://www.nottingham.ac.uk