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Details of Grant 

EPSRC Reference: GR/M31163/01
Title: A SYSTEMATIC STUDY OF STRAIN INDUCED X-RAY LINE PROFILE BROADENING
Principal Investigator: Clark, Dr S
Other Investigators:
Tang, Dr C
Researcher Co-Investigators:
Project Partners:
University of Sydney
Department: Photon Science
Organisation: STFC Laboratories (Grouped)
Scheme: Standard Research (Pre-FEC)
Starts: 01 January 1999 Ends: 30 June 2000 Value (£): 8,293
EPSRC Research Topic Classifications:
Condensed Matter Physics
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
A simple quick diagnostic technique is needed for measuring and interpreting microstrain structures in deformed materials. This is very important in many areas of material research concerned with the failure, fatigue and performance of materials under stress. We seek to develop a better, more informative and generally applicable analytical tool for measuring and interpreting microstrain structures based on x-ray diffraction line broadening. Current x-ray diffraction methods are at best only semi-quantitative and provide no insight into the physical phenomena producing microstrains. Recent developments in modelling of diffraction line broadening now make it possible to move to a fully quantitative approach. We propose to collect the highest possible quality x-ray powder diffraction patterns, using synchrotron radiation, from very well characterised thin foils of Al and Cu held at accurately known strains. We will use this high quality data to test the current models of diffraction line broadening and develop a simple procedure for the application of these models to the analysis of profiles collected using the normal laboratory x-ray sources. This work will benefit the many hundreds of academic and industrial researchers who use x-ray line broadening for the analysis of strains in bulk and surface structures
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