EPSRC Reference: |
GR/M30173/01 |
Title: |
JREI: HIGH RESOLUTION X-RAY SCATTERING |
Principal Investigator: |
Hatton, Professor PD |
Other Investigators: |
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Researcher Co-Investigators: |
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Project Partners: |
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Department: |
Physics |
Organisation: |
Durham, University of |
Scheme: |
JREI |
Starts: |
18 March 1999 |
Ends: |
17 March 2002 |
Value (£): |
124,435
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EPSRC Research Topic Classifications: |
Materials Characterisation |
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EPSRC Industrial Sector Classifications: |
No relevance to Underpinning Sectors |
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Related Grants: |
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Panel History: |
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Summary on Grant Application Form |
X-ray scattering is a non-destructive technique capable of providing new insights into the behaviour and properties of crystalline solids and thin films. The proposed x-ray diffractometer will have a resolution considerably greater than that of existing diffractometers which will improve our capability for studying sub-micron thick films of superconductors (Yba2Cu3O7), semiconductors and metals (e.g. Fe/Au multilayers). These studies will provide insight into the interface strain and growth of high quality superconductors on different substrates including vicinal surfaces and novel electron channelling in metal superlattices. In addition, the provision of focusing mirrors and asymmetric crystal optics will provide very high x-ray intensities which will provide the capability for studying weakly scattering phenomena such as charge stripes in transition metal oxides (La2* Sr*NiO4) and colossal magneto resistance perovskites (Bi1*Ca*MnO3, Pr1*Ca*MnO3 etc), charge density waves (NbSe2) and incommensurate structures (Bi2Sr2CaCu2O8). Such studies provide information on the wavevector of charge stripes their width and long range correlation as well as critical exponents of such low dimensional systems. Furthermore, the high resolution will allow for improved characterisation of superconductor and semiconducting (e.g. CdTe) single crystals. To date such studies have relied upon the provision of expensive synchrotron radiation beamtime at central facilities. The new diffractometer will have a resolution and x-ray beam intensity sufficient to undertake such studies in-house.
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Key Findings |
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Potential use in non-academic contexts |
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Impacts |
Description |
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Summary |
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Date Materialised |
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Sectors submitted by the Researcher |
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Project URL: |
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Further Information: |
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Organisation Website: |
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