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Details of Grant 

EPSRC Reference: GR/M30173/01
Title: JREI: HIGH RESOLUTION X-RAY SCATTERING
Principal Investigator: Hatton, Professor PD
Other Investigators:
Tanner, Prof. B
Researcher Co-Investigators:
Project Partners:
Bede Scientific Instruments Ltd Pre Nexus Migration
Department: Physics
Organisation: Durham, University of
Scheme: JREI
Starts: 18 March 1999 Ends: 17 March 2002 Value (£): 124,435
EPSRC Research Topic Classifications:
Materials Characterisation
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
X-ray scattering is a non-destructive technique capable of providing new insights into the behaviour and properties of crystalline solids and thin films. The proposed x-ray diffractometer will have a resolution considerably greater than that of existing diffractometers which will improve our capability for studying sub-micron thick films of superconductors (Yba2Cu3O7), semiconductors and metals (e.g. Fe/Au multilayers). These studies will provide insight into the interface strain and growth of high quality superconductors on different substrates including vicinal surfaces and novel electron channelling in metal superlattices. In addition, the provision of focusing mirrors and asymmetric crystal optics will provide very high x-ray intensities which will provide the capability for studying weakly scattering phenomena such as charge stripes in transition metal oxides (La2* Sr*NiO4) and colossal magneto resistance perovskites (Bi1*Ca*MnO3, Pr1*Ca*MnO3 etc), charge density waves (NbSe2) and incommensurate structures (Bi2Sr2CaCu2O8). Such studies provide information on the wavevector of charge stripes their width and long range correlation as well as critical exponents of such low dimensional systems. Furthermore, the high resolution will allow for improved characterisation of superconductor and semiconducting (e.g. CdTe) single crystals. To date such studies have relied upon the provision of expensive synchrotron radiation beamtime at central facilities. The new diffractometer will have a resolution and x-ray beam intensity sufficient to undertake such studies in-house.
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