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Details of Grant 

EPSRC Reference: GR/M06680/01
Title: NEW APPROACHES TO HIGH SENSITIVITY ION BEAM LUMINESCENCE ANALYSIS
Principal Investigator: Townsend, Professor P
Other Investigators:
Roche, Professor P Hole, Dr D E
Researcher Co-Investigators:
Project Partners:
Department: Sch of Engineering and Design
Organisation: University of Sussex
Scheme: Standard Research (Pre-FEC)
Starts: 01 August 1998 Ends: 31 January 2002 Value (£): 145,664
EPSRC Research Topic Classifications:
Condensed Matter Physics Materials Synthesis & Growth
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
1) Ion beam luminescence will be developed and used for both imaging and sub-surface analysis of the impurities and structural imperfections which exist in insulating materials. The imaging capability has scarcely been exploited and spectral data are rarely related to imaging. This is despite the fact that considerable sensitivity is now possible to the point that even readily damaged materials, such as plastics, could be plastics, could be examined. Luminescence examination of sub-surface material, to depths of 20 to 40 microns, is possible with the 3 MeV H and He ion beams at Sussex, avoiding the near-surface problems caused by sample preparation, (as experienced with cathodoluminescence). High sensitivity will be achieved with a photon imaging camera.2) Ion beam spectrochemical analysis is currently less sensitive than SIMS depth analyses, but by using a photon imaging camera we expect to increase the sensitivity of the method by several hundred times and additionally assess the energy of the ejected neutral and ionised particles. This would provide a powerful new surface analytical technique. Problems to be addressed initially relate to variations in surface composition of glass, thin film coating and surface structures on insulators.
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Organisation Website: http://www.sussex.ac.uk