| EPSRC Reference: |
GR/L28159/01 |
| Title: |
RELIABILITY DESIGN FOR ULTRA-SHORT GATE CMOS TECHNOLOGIES |
| Principal Investigator: |
Taylor, Professor S |
| Other Investigators: |
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| Department: |
Electrical Engineering and Electronics |
| Organisation: |
University of Liverpool |
| Scheme: |
Standard Research (Pre-FEC) |
| Starts: |
09 June 1997 |
Ends: |
08 June 2000 |
Value (£): |
126,292
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Summary on Grant Application Form |
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The silicon MOSFET is the basic 'building block' of the majority of integrated circuits, including VLSI memory chips and ASICs. The operating characteristics of a MOSFET deteriorate during its lifetime, dependent on the electrical stress experienced. Eventually the MOSFET ceases to operate within its intended specification; this behaviour, repeated in even a small fraction of a FETs in a chip, can lead to unreliability or complete failure. In short-gate devices (which offer higher speeds and integration densities) the electrical stresses are greater, leading to accelerated degradation. Progress to ultra-small feature sizes (0.1 micron and less) in CMOS will be dependent on the ability of 'design out' degradation at the device level.The aims of this project are, by a combination of advanced theoretical and experimental techniques, to gain a detailed understanding of the physical mechanisms of hot electron-induced degradation of ultra-short-gate devices. This understanding will then be used to develop an accurate ageing simulator for VLSI OMOS design. Alternative FET gate dielectric materials will also be investigated in the quest for improved device reliability.
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Key Findings |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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Potential use in non-academic contexts |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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Impacts |
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| Description |
This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk |
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Sectors submitted by the Researcher |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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| Project URL: |
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| Further Information: |
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| Organisation Website: |
http://www.liv.ac.uk |