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Details of Grant 

EPSRC Reference: GR/K72018/01
Title: HIGH RESOLUTION X-RAY SCATTERING FOR THIN FILM CHARACTERIZATION
Principal Investigator: Tanner, Prof. B
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Bede Scientific Instruments Ltd
Department: Physics
Organisation: Durham, University of
Scheme: Standard Research (Pre-FEC)
Starts: 01 May 1996 Ends: 30 April 1999 Value (£): 178,737
EPSRC Research Topic Classifications:
Materials Characterisation
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Summary on Grant Application Form
We propose to develop and exploit a novel goniometer to perform X-ray scattering measurements on magnetic multilayers. Multilayer X-ray mirrors, recently available commercially, will be used to provide high intensity incident beams and medium resolution analysers with X-ray optics designed to optimise grazing incidence diffuse scattering and high angle medium resolution reciprocal space mapping. Together with anomalous dispersions synchrotron radiation measurements, we will use these novel configurations to measure the roughness, correlation lengths and fractal parameter of transition metal-transition metal multilayers to extend our present studies on the rle of interface structure in the giant magnetoresistance and other magnetic and magnetotransport properties. Similarly, we will investigate the rle of interface roughness on the anisotropy of transition metal-noble metal systems for magnetic recording applications. In parallel, medium resolution studies of the scattering at high angles will be undertaken on both types of system to relate structural, textural and metallurgical properties of the multilayers to the magnetic phenomena.
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