| EPSRC Reference: |
GR/K04170/01 |
| Title: |
MULTIPLE DEFECT ANALYSIS FOR LINEAR MACROS IN MIXED-SIGNAL SYSTEMS USING TRANSIENT RESPONSE ANALYSIS |
| Principal Investigator: |
Taylor, Professor D |
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| Department: |
Electrical & Electronic Engineering |
| Organisation: |
University of Huddersfield |
| Scheme: |
Standard Research (Pre-FEC) |
| Starts: |
15 December 1994 |
Ends: |
14 December 1995 |
Value (£): |
25,960
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| EPSRC Research Topic Classifications: |
| Design & Testing Technology |
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Summary on Grant Application Form |
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To refine the concept of Transient Response Analysis so that the effects of multiple circuit defects can be distinguished during testing and additional diagnostic information produced for marginal devices. Progress:A Research Assistant was appointed to the project in December 1994 and some progress has been made. A number of circuit responses exhibiting a range of defects have been captured and existing response analysis software has been updated to include a time-domain discriminant function. Multiple runs of the analysis software will now be employed using different discriminant functions in order to identify individual defects.
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Key Findings |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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Potential use in non-academic contexts |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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Impacts |
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| Description |
This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk |
| Summary |
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| Date Materialised |
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Sectors submitted by the Researcher |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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| Project URL: |
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| Further Information: |
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| Organisation Website: |
http://www.hud.ac.uk |