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Details of Grant 

EPSRC Reference: GR/J67321/01
Title: A NEW METHOD FOR DEFECT STUDIES IN OPTICAL THIN FILMS OR SURFACE LAYERS OF INSULATORS
Principal Investigator: Townsend, Professor P
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Department: Mathematical & Physical Sciences
Organisation: University of Sussex
Scheme: Standard Research (Pre-FEC)
Starts: 01 April 1994 Ends: 31 March 1997 Value (£): 67,456
EPSRC Research Topic Classifications:
Materials Characterisation
EPSRC Industrial Sector Classifications:
Manufacturing
Related Grants:
Panel History:  
Summary on Grant Application Form
The presence of imperfections in the surface region of crystals, glasses and ceramics play an important role in their stability, and optical properties. This is clearly apparent for thin film coatings, waveguiding surface layers or reactive and hygroscopic materials. Characterisation and quantitative measurements of such defects are difficult to separate from bulk features. The current proposal involves the use of sensitive spectrally resolved thermoluminescence to quantify and separate trapping levels [by temperature] and recombination centres [by spectra]. The novel approach is to use low energy electron irradiation to populate the traps only within a micron of the surface. Such TL data will be complemented by the cathodoluminescence signals occurring during electron irradiation which typically stimulate many different or additional transitions. This new TL technique is applicable for studies of deposited thin films, polishing strain and damage, surface waveguides influenced by crystal preparation, and atmospheric chemical reactions at the surface. Potentially this is a powerful and wide ranging new approach to studies of imperfections in insulator surfaces.
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Organisation Website: http://www.sussex.ac.uk