EPSRC Reference: |
GR/J28438/01 |
Title: |
DIFFUSION AND STRUCTURAL STUDIES OF THIN FILMS AND MULTILAYERS |
Principal Investigator: |
Greer, Professor AL |
Other Investigators: |
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Researcher Co-Investigators: |
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Project Partners: |
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Department: |
Materials Science & Metallurgy |
Organisation: |
University of Cambridge |
Scheme: |
Standard Research (Pre-FEC) |
Starts: |
01 October 1993 |
Ends: |
30 June 1997 |
Value (£): |
116,219
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EPSRC Research Topic Classifications: |
Materials Characterisation |
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EPSRC Industrial Sector Classifications: |
Manufacturing |
Electronics |
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Related Grants: |
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Panel History: |
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Summary on Grant Application Form |
Phase selection and microstructural development in thin film deposition are important in optimising materials for device applications. Stability of microstructure is also important. Very fine scale nanocomposites obtained from deposition of immiscible phases offer exciting prospects for novel properties. This project is on the precision deposition of thin films and multilayers for the following studies: 1) self-diffusion in hcp, bcc and ccp metals; the use of isotopically layered multilayers permits the evaluation of the effects of ultra-short diffusion distances. 2) microstructural development and stability of immiscible two-phase nanocomposites. 3) tests of the Darken relations for interdiffusion; the conventional Darken relations may be invalidated by stress effects and by strong chemical effects. 4) accuracy of multilayer interdiffusion measurements in a model crystalline system, Ag-Au. Studies of the microstructural, gradient energy and chemical ordering effects in Ag-Au. 5) phase selection in titanium - transition metal thin films (eg Ti54Zr26Ni20) to probe the transitions between amorphous, crystalline and different quasicrysalline structures.
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Key Findings |
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Potential use in non-academic contexts |
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Impacts |
Description |
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Summary |
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Date Materialised |
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Sectors submitted by the Researcher |
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Project URL: |
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Further Information: |
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Organisation Website: |
http://www.cam.ac.uk |