EPSRC Reference: |
GR/J23020/01 |
Title: |
THEORETICAL ANALYSIS OF RHEED AZIMUTHAL PLOTS |
Principal Investigator: |
Beeby, Professor J |
Other Investigators: |
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Researcher Co-Investigators: |
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Project Partners: |
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Department: |
Physics and Astronomy |
Organisation: |
University of Leicester |
Scheme: |
Standard Research (Pre-FEC) |
Starts: |
01 February 1994 |
Ends: |
31 January 1995 |
Value (£): |
30,781
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EPSRC Research Topic Classifications: |
Materials Characterisation |
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EPSRC Industrial Sector Classifications: |
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Related Grants: |
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Panel History: |
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Summary on Grant Application Form |
Reflection high energy electron diffraction (RHEED) and experimental derivatives such as reflection electron microscopy (REM) are of substantial current interest because of their use in epitaxial semiconductor growth and microscopic surface studies. Fundamental work by Joyce and colleagues (now at the Semiconductor IRC in London) has demonstrated the practical value of these methods [1] and the Leicester theory group has developed extensive formal and computational methods for analysis of the data they generate [2] [3]. The latest work at Leicester has centred on the azimuthal dependence of the RHEED intensities which was previously thought to be extremely difficult to analyse. However, Dr Mitura, the proposed visiting fellow, has recently demonstrated remarkable agreement between theory and experiment (see fig 1). The purpose of this proposal is to apply this promising approach to data collected at the IRC. This represents an opportunity for two internationally recognised teams to collaborate on an exciting new development with potential for improving techniques for epitaxial growth and providing a new method of semiconductor surface analysis.
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Key Findings |
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Potential use in non-academic contexts |
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Impacts |
Description |
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Summary |
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Date Materialised |
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Sectors submitted by the Researcher |
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Project URL: |
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Further Information: |
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Organisation Website: |
http://www.le.ac.uk |