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Details of Grant 

EPSRC Reference: EP/C536045/1
Title: Development of an SEM detector for nanometric analysis
Principal Investigator: Tear, Professor SP
Other Investigators:
El-Gomati, Professor M Jacka, Dr M
Researcher Co-Investigators:
Project Partners:
Department: Physics
Organisation: University of York
Scheme: Standard Research (Pre-FEC)
Starts: 01 September 2005 Ends: 31 January 2009 Value (£): 257,645
EPSRC Research Topic Classifications:
Instrumentation Eng. & Dev.
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
Since its development in the 1960's the scanning electron microscope (SEM) has had a very significant impact across a wide range of disciplines: medicine, biology, physics, materials science, engineering, and chemistry. The principle of the SEM is to use a beam of electrons to investigate materials instead of light as in a normal light microscope. The electrons enter the sample of interest and are scattered by the electrons and atoms that comprise the solid. After scattering some of the electrons have directions of travel which allow them to escape out of the sample. These electrons are detected and counted by electron detectors to give a signal. The electrons scattered in the sample undergo many interactions, some are elastically scattered, while others loose certain, characteristic, amounts of energies when they scatter off the atoms within the solid. It is these electrons which have lost characteristic amounts of energy which this project will focus on. Specific detectors will be built to collect these energy loss electrons and simulations of the electron paths and scattering processes within the solid will be carried out with the aim of quantifying the intensity of the signals detected and relating this to the structure, types of atoms and their concentrations in the sample.
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Organisation Website: http://www.york.ac.uk