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EPSRC Reference: EP/C511212/1
Title: Chemical, Structural and Luminescence Mapping Of Surfaces Using Micro-Imaging Optical Detection Of X-Ray Absorption Spectra
Principal Investigator: Poolton, Dr N
Other Investigators:
Hamilton, Professor B
Researcher Co-Investigators:
Project Partners:
Department: Photon Science
Organisation: STFC Laboratories (Grouped)
Scheme: Standard Research (Pre-FEC)
Starts: 05 February 2005 Ends: 04 August 2006 Value (£): 209,491
EPSRC Research Topic Classifications:
Analytical Science Instrumentation Eng. & Dev.
Materials Characterisation
EPSRC Industrial Sector Classifications:
Electronics
Related Grants:
Panel History:  
Summary on Grant Application Form
The ability to understand the optical properties of semiconductors and insulators, and how these are intimately related to the structure of the materials is a cornerstone of both past and future development of new opto-electronic materials. One method that can achieve this is that of Optically-Detected Xray Absorption Spectroscopy (OD-XAS) where x-ray absorption features (related to the chemistry and structure of a sample) are recorded directly fromthe luminescence emission.Hitherto, measurements have involved detection and analysis of volume-integrated luminescence emitted from the samples under study In many instances however, the most relevant samples to study are not homogeneous, but complex meso- or nano-structured systems, where the extended structure critically determines the optical emission properties. Obvious examples are opto-electronically engineered quantum wells and superlattices, and bulk systems where phase-segregation occurs on microscopic scales due to immiscibility of the constituent atoms.One obvious way to tackle the problems associated with spatial variability of the OD-XAS spectra is to undertake the measurements in imaging mode, thereby allowing the chemical, luminescence and structural maps of the materials to be derived directly. The purpose of this EPSRC research application is thus to explore, for the first time, the possibilities of implementing far-field imaging OD-XAS.
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